Published: ,
Modified: , N.T.
This application note compares X-ray images of four common USB cable connectors: USB 2.0 (Type-A), Micro-USB (Micro-B), USB 3.0 (Type-A), and USB Type-C.
Non-destructive X-ray inspection reveals clear differences in internal structure and wiring density. While standard USB 2.0 and Micro-USB connectors display relatively simple four-line configurations, USB 3.0 and Type-C connectors exhibit significantly higher complexity. Notably, the X-ray image of the Type-C connector clearly reveals an internal printed circuit board (PCB) and fine-pitch connections. These details demonstrate the necessity of high-resolution X-ray systems for verifying soldering quality and internal integrity in modern electronics.
X-ray System Parameters
| Focal spot | Microfocus |
|---|---|
| X-ray tube voltage | 130 kV |
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