Advanced styluses, such as the Apple Pencil, incorporate complex internal assemblies to support features like tilt and pressure sensitivity. X-ray inspection reveals a high-density internal structure, making high-resolution imaging essential for analysis. Among the samples examined, the Apple Pencil exhibits the highest component density.
Microfocus X-ray imaging provides a detailed view of the intricate internal layout. This capability allows for the precise inspection of fine components and connections within the densely packed housing, ensuring clear visibility even for complex assemblies.
X-ray System Requirements
| Focal Spot | Microfocus |
|---|---|
| X-ray Tube Voltage | 130 kV |
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