High voltage power supplies for Scanning Electron Microscope (SEM)
Scanning Electron Microscopes (SEM) rely on electron beams accelerated by high-voltage power supplies to observe microscopic structures. Stable acceleration and bias voltages are essential; fluctuations can cause beam instability, resulting in chromatic aberration, blurred images, and reduced resolution.
Matsusada Precision offers high-voltage power supplies engineered specifically for SEM applications, featuring exceptional stability, low temperature coefficients, and ultra-low ripple. We also provide compact, integrated modules that combine accelerator, bias, and filament power sources into a single unit, simplifying system integration and design.
SEM with typical Electron gun
High voltage power supplies for Mass Spectrometry (MS)
Mass Spectrometry uses ion beams for precise detection and analysis, requiring power supplies with superior stability. In Time-of-Flight Mass Spectrometry (TOF-MS), for instance, the acceleration voltage directly determines the kinetic energy of ions. Any instability causes variations in flight time, leading to broadened peaks and degraded mass resolution.
Matsusada Precision's power supplies are optimized for these demanding environments. With high stability and low ripple performance, our units ensure the consistent acceleration energy required for reliable, high-precision analysis.
Related Technical Articles
- Scanning Electron Microscopy (SEM) - Basic knowledge
- SEM Tech Explained, Part 1: Acceleration Voltage and Image Quality
- SEM Tech Explained, Part 2: A Guide to Electron Microscope Lenses
- SEM Tech Explained, Part 3: Principles of SEM Elemental Analysis
- Application: Scanning Electron Microscope (SEM)
- Power Supply Solutions for Mass Spectrometry
- Application: Mass Spectrometry (MS)
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Matsusada Precision's high-performance High voltage power supplies for Scanning Electron Microscope (SEM) and Mass spectrometry (MS)
