How do I choose the right X-ray inspection system for my application?

The optimal X-ray inspection system depends on the physical size of your sample and the level of detail required to detect defects. High magnification is necessary for microscopic analysis, but this results in a narrower Field of View (FOV). Understanding the balance between sample size, magnification, and FOV is essential for successful inspection.
We cover these technical concepts in detail in our Tech Tips article, "What is Microfocus X-ray Technology? (Basic Knowledge)."
Please refer to this guide to help select the best configuration for your application.