An energy dispersive type X-ray fluorescence analyzer in pursuit of usability
Notice: Discontinued Product Production and sales of the RX5000 Series ended in November 2020. However, we continue to provide product support and maintenance services.
For details, please contact us.
User-Friendly Energy Dispersive X-ray Fluorescence Spectrometer
The RX5000 Series is an Energy Dispersive X-ray Fluorescence (ED-XRF) spectrometer designed for screening hazardous substances, making it ideal for RoHS and ELV compliance testing. The system detects elements ranging from Mg (Magnesium) to U (Uranium) and supports a wide variety of sample types, including solids, liquids, and powders. Featuring one of the largest sample chambers in its class, the RX5000 can accommodate large items without pre-processing. Additionally, the 16-position automatic turret enables continuous measurement of multiple samples for high efficiency.
Features and Benefits
- Non-destructive analysis: No chemical pre-treatment or sample dissolution required.
- Large sample chamber: Spacious enough to accommodate a laptop computer.
- Compact footprint: Desktop design with a width of only 19 inches (480 mm).
- High throughput: 16-position automatic turret for continuous multi-sample measurement.
- Easy maintenance: Features an electronically cooled detector, eliminating the need for liquid nitrogen.
- Ready to use: Calibration curves for hazardous substances are pre-installed.
Functions
Simple, one-click operation
With an interface focused on usability, the RX5000 allows anyone to perform measurements with a simple one-click operation on the PC.
Sophisticated user interface
RX5000 includes a user aid function to automatically perform the detection of the measurement subject element and a judgment of the result of a measurement. Furthermore, we adopt the original control logic which can do operation intuitively, pursue usability thoroughly, and realize simple operation of the wonder.
For example: "Measurement Result Screen"
Outstanding compact design
Horizontal width of as small as approx. 19-inch (480mm)
Compared to the conventional X-ray fluorescence analyzers in the same category, outstandingly compact design has been achieved with the
RX5000. This analyzer ensures high-precision measurement without interfering with work in the field.
Compact design with full-fledged sample room
Large sample chamber equipped as standard
One of the largest sample chambers in its class (W15" × D15" × H6") is included as a standard feature. Large samples can be measured directly without cutting or resizing.
Automatic turret for changing 16 samples
Turret capable of automatic switching to 16 different kinds of samples is standardly included. There is no need for changing samples as measurement of multiple samples can be performed effortlessly.
Full of useful functions that supporting various analysis
High-sensitivity analysis with the primary filter
Three kinds of filters are standardly included to increase detection sensitivity by reducing the background components that interfere with the identification of the trace element spectrum.
Key Feature
Automatic filter changing function
A filter more suitable for the measurement target element will be selected.
| Filter | Measurement element [e.g.] |
|---|---|
| A | Cr |
| B | Br, Pb, Hg |
| C | Cd |
Shape correction function
If samples of the same content differ in shape and thickness, the determination value obtained from the analysis may also include a gap. As the accompanying software, RX-analyzer, automatically corrects this gap, highly precise results can be obtained without consideration of sample shape
Waveform separating function
Analysis lines for the measurement target may overlap in terms of energy, such as with the As-Kα line and the Pb-Lα line. In order to obtain precise determination of the overlapping elements, peaks of the elements should be separated from the one overlapping peak. The accompanying software, RX-analyzer, features an original method for automatically separating the peaks to perform high-precision measurements.
Thin-film analysis support
The thin-film FP method can calculate the film thickness and composition of each layer of multilayer thin films (optional).
Spectral matching function
This function uses the already saved measurement spectrum of a sample of which constituent elements and content ratio are known to compare with an unknown sample spectrum. In this way, this function can determine which known sample is similar to the unknown sample.
Examples of utilization
Discrimination of steel types such as SUS
This function can discriminate between SUS304 and SUS316.
Judgment of impurity incorporation
This function can judge acceptance/rejection based on the comparison between the target spectrum and the spectrum that has already been accepted.
PE-PVC automatic judgment function
It is necessary to determine the quantity of PE (polyethylene) samples,
often used in the plastic samples,
and the quantity of PVC (polyvinyl chloride) by using different calibration curves. However, as the accompanying software, RX-analyzer, is automatically
able to select calibration curves by detecting chlorine in the PVC; the steps involved in choosing the calibration curves can be avoided.
Reporting function
The accompanying software, RX-analyzer, can output measurement results and conditions in a report format. This format covers necessary information and can be used for multiple purposes.
Options
Multilayer thin-film FP
This is the optional software for measuring the thickness of thin film.
※This is an image.
Standard materials
Various standard materials that can be used for creating calibration curves and performing comparison measurement have been prepared.
Sample cup
This is used for measuring minute samples, powders, liquid samples, etc. Cups of various shapes are available according to use.When using the cups, Mylar™film is necessary.
Mylar™film
This film is used with the sample cup. Both rolled film and cut film are available. Mylar™
* Mylar is a registered trademark of DuPont.
Laptop Computer
It is possible to change from a desktop computer to a laptop computer.
* This is an image picture.
Specially designed desk
The specially designed desk is suitable for the size of the equipment
＊We will be flexible in responding to requests for additional calibration curves and measurement conditions.
Models
| Model | X-ray tube voltage | Shape of sample room | Detector |
|---|---|---|---|
| RX5000 | 50kV |
Contact our sales office for detailed. |
Electronic cooling-type semi-conductor detector |
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RX5000 series Datasheet
PDF（598KB）
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RX5000 series Datasheet
PDF（598KB）
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