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Matsusada Precision to Exhibit at the 35th ELECTROTEST JAPAN

  • Event
35th ELECTROTEST JAPAN

Matsusada Precision will exhibit at the 35th ELECTROTEST JAPAN, held concurrently with NEPCON JAPAN, from January 20th to 22nd, 2021, at Tokyo Big Sight. We will showcase a range of inspection systems ideal for diverse applications, including semiconductors, electronic components, automotive parts, and medical devices.

Visit us at Booth W9-64 to experience our latest technologies, including our new high-resolution, low-acceleration scanning electron microscope. We look forward to welcoming you.

Dates
January 20th-22nd, 2021 | 10:00 am - 6:00 pm (Closing at 5:00 pm on the final day)
Venue
Tokyo Big Sight
Zone
Non-Destructive Inspection Zone
Booth
W9-64
Pre-Registration
Request free visitor Ticket to NEPCON JAPAN is here.

Main exhibits

This image is precision µB3600.
  • New product

X-ray inspection system precision µB3600

Compact and High Quality

The precision µB3600 is a benchtop X-ray inspection system delivering a 90kV tube output in a compact form factor. The unit is designed for ergonomics, allowing operators to easily load and unload samples while seated.
precision µX7800

X-ray inspection system precision µX7800

Slim Body with Large Field of View

The precision µX7800 is an all-around X-ray inspection system designed to maximize the field of view. It features a wide access door for easy loading of large samples and supports a broad magnification range for versatile imaging.
Precision CT7400

X-ray CT system precision CT7400

Fully Automatic Optimization for Ideal Imaging

The precision CT7400 is a horizontal X-ray CT system offering high resolution and high-speed performance. With its proprietary conditioning system, the unit eliminates the need for axis calibration and fully automates the adjustment of shooting conditions and positioning.
Precision SEM5600
  • New product

New scanning electron microscope precision SEM5600

Improved Operability with Auto Stage

The precision SEM5600 is a surface structure analysis SEM featuring the industry's first optical Dual Lens system. Leveraging Matsusada's proprietary technology, this SEM achieves high-resolution observation even at low acceleration voltages.