No, our X-ray inspection systems are not designed for X-ray analysis (elemental analysis).
X-ray inspection systems use transmission X-rays to visualize the internal structure of an object. These systems utilize an imaging detector to capture X-rays passing through the target, creating a radiographic image based on density differences.
In contrast, X-ray analysis (such as XRF) is a technique used to determine the elemental composition of a material. This method requires an analyzer to detect the energy or wavelength of fluorescent X-rays emitted from the material itself.