No, our X-ray inspection systems are not designed for X-ray analysis.
An X-ray inspection system creates a radiographic image by visualizing the internal structure of an object. It uses a detector (camera) paired with a scintillator, which converts X-rays that pass through the object into visible light.
In contrast, X-ray analysis is a technique used to determine the elemental composition of a material. This requires a different type of detector (an analyzer) that measures the energy (or wavelength) of fluorescent X-rays emitted from the material.