SEM (Scanning Electron Microscope) is a type of electron microscope. By using electrons, which have a shorter wavelength than light, it is possible to see finer images than with optical microscopes that use visible light.
A scanning electron microscope scans a specimen with a narrowly focused electron beam in a vacuum, and constructs and displays an image from information on the coordinates of the electron beam. Normally, the image is acquired using secondary electrons emitted from the object under the influence of the incident electrons. In addition to images of secondary electrons, scanning electron microscopes detect reflected electrons, transmitted electrons, X-rays, cathodoluminescence, internal electromotive force, etc., and analyze various information such as data on the composition of the sample.
Among scanning electron microscopes, those that use transmitted electrons are called STEM (Scanning Transmission Electron Microscope). In some cases, scanning electron microscopes apply a negative bias voltage to the sample stage in order to obtain a clear image.
Matsusada Precision offers a wide range of power supplies for scanning electron microscopes, including the PrecisionSEM5600, high voltage power supplies for acceleration, filaments, bias, lenses, and detectors.
- Related words:
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- X-ray
- secondary electron
- incident electron
- bias
- cathode luminescence
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In addition to Scanning Electron Microscope PrecisionSEM5600, we have various kind of products such as high voltage power supplies for acceleration that are available for electron microscopes along with power supplies for filaments, bias, lenses, and detectors.
