High voltage power supplies for Scanning Electron Microscopy: ultra low ripple, high stability output



		High voltage power supplies for scanning electron microscopy (SEM) applications A Scanning Electron Microscope (SEM) requires quite stable HV outputs for clear imaging. Matsusada's various high voltage modules with low ripple noise and high stability are ideal for that application. Do not hesitate, choose quite stable and low noise high voltage power supplies for your equipment. HVPS with various floating outputs are available for your scanning electron miscroscopy requirements. Should you need specifications not offered by our standard products, we are able to respond quickly and efficiently to your requirements and thereby to reduce your development cycles.
				Exceptionally low ripple plus a wide range of high voltage and power for crisp SEM imaging
				Spike noise as well as ripple noise affect the Electron Beam whose precision is critical for Scanning Electron Microscopy. Matsusada's high voltage power supplies for E-Beam provide better controlled noise, higher stability or better temperature coefficient for your applications. For some models you can optionally ask for even better characteristics to meet the requirements of your high end scanning electron microspy application. HEB/HIB Ultra low ripple / high stability high voltage power supplies Low temperature coefficient. Floating level : 4 ch PS programmable with Vmon and Imon for each PS. Ground level : 1 ch PS programmable with Vmon and Imon. Custom configuration with additional output is available. Various models with high voltage up to 100 kV are available. Product detail AF Low ripple 10 ppm, high stability 50 ppm/Hr (AE Series). Wide line-up of high voltage power supply from 1 to 150 kV and 30 W to 300 W. Local & remote operation. Front panel adjustable overload trip level. Remote & front panel monitoring of DC output voltage & current. GP-IB interface option. Product detail K7 series Exceptional low ripple / high stability. Remote & local programming. Fully protected against continuous short circuit. Optional output connector. Specially developed for Mass Spectrometer application, it can also be used as a power supply for Electron Beam biasing, deflection and focusing. Product detail K3-R Ultra low ripple 0.001% p-p. High stability 0.001%/5min. Reverse polarity control. Constant voltage control. Output voltage monitor. Overvoltage & short circuit protection. Product detail Catalog Request \| Call / fax If you would like assistance in selecting a model for your scanning electron microscopy application, or if, as an OEM, you wish a custom design solution, please do not hesitate to contact Matsusada: Custom design for OEM \| Model selection assistance Top
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