Electron Microscope power supplies - Multi function high stability rack mount
HEB/HIB series has been developed in E-beam/I-beam application, and designed with the concept of open architecture, which allows for these systems to satisfy wide variety of the most demanding requirements. You can operate both the keypad and your PC via USB, RS-232C or GPIB.
HEB/HIB series has been developed for E-beam/I-beam applications, and designed with the concept of open architecture, which allows for these systems to satisfy wide variety of the most demanding requirements. It is easy to change the output of each output by just replacing the module, and investment is to be kept minimum. You can operate the system both the keypad and your PC via USB, RS-232C or GPIB.
Main features
Possible applications
- Ultra Low Ripple
- High stability
- Low temperature coefficient.
- Floating level: 4 ch PS programmable with Vmon and Imon for each PS.
- Ground level: 1 ch PS programmable with Vmon and Imon.
- Custom configuration with additional output is available.
- Various models up to 100 kV are available.
Possible applications
- Electron Beam
- Focused Ion Beam (FIB)
- Ion Beam
- Ion Implanting
- Lithography
- Mass Spectrograph
- Mass Spectrometer
- Scanning Electron Microscopy (SEM)
- X-ray Tube
| Output | |
|---|---|
| Voltage | Current |
| -10kV | 500µA |
| -2kV | 100µA |
| 5V | 5A |
| 5kV | 500µA |
| 7kV | 500µA |
